Birgit Kammlander

Short presentation

My research project involves the characterisation of perovskite thin films for optoelectronic devices and perovskite single crystals under different stressors. It focuses on the analysation of surfaces / interfaces under different experimental conditions using (synchrotron-generated) X-ray photoelectron spectroscopy. The aim is to improve the external stability of the perovskite devices by investigating chemical and electronic changes upon i.e. heat, laser or light exposure.

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